Optical Analysis
Our optical analysis-based micro-nano detection technology serves as the “intelligent eye” for observing the micro-nano world. With its unique advantages of non-contact operation and high precision, it safeguards cutting-edge scientific research and advanced manufacturing.
AOI Wafer Defect Inspection
Learn More
SiC Wafer Dislocation Defect Inspection
Learn More
Spectral Confocal
Learn More
White-Light Interferometry
Learn More
X-ray Inline Inspection of Al-Shell Battery Electrode Tabs (Fully Automatic)
Learn More
Internal-Defect Inspection (X-ray / Industrial CT)
Learn More