Film Thickness Inline Measurement & Control System

Film Thickness Inline Measurement & Control System

Equipped with X-ray, beta-ray, infrared, white-light interferometry, and spectral confocal sensors, the system performs non-contact online measurement of film basis weight and thickness. It uses self-developed CD/MD closed-loop algorithms to automatically regulate extrusion and coating parameters, ensuring uniform film thickness and optimal material quality across the entire process.

Closed-Loop Control

Closed-Loop Control

High-Precision Measurement

High-Precision Measurement

Non-Contact NDT

Non-Contact NDT

Intelligent Data Analysis

Intelligent Data Analysis

+86   0571-88912732
+86   0571-88912732