Film Thickness Inline Measurement & Control System
Equipped with X-ray, beta-ray, infrared, white-light interferometry, and spectral confocal sensors, the system performs non-contact online measurement of film basis weight and thickness. It uses self-developed CD/MD closed-loop algorithms to automatically regulate extrusion and coating parameters, ensuring uniform film thickness and optimal material quality across the entire process.
Closed-Loop Control
High-Precision Measurement
Non-Contact NDT
Intelligent Data Analysis