Film Surface Defect Inline Inspection System

Film Surface Defect Inline Inspection System

Using self-developed high-speed intelligent cameras and AI-based image analysis, the system detects crystal points, black spots, impurities, scratches, and pinholes across diverse film materials. With 200 kHz imaging and HDR dynamic capture, it ensures distortion-free imaging and consistent precision. Combined with multi-angle LED illumination and adaptive control, it supports different web widths and film types. The system auto-generates defect maps and trend reports, and the SYAITR platform enables continuous deep-learning optimization. Applicable to packaging film, optical film, and lithium separator production lines.

Intelligent Camera

Intelligent Camera

Deep Learning

Deep Learning

Defect Recognition

Defect Recognition

Real-Time Analysis

Real-Time Analysis

+86   0571-88912732
+86   0571-88912732