Film Surface Defect Inline Inspection System
Using self-developed high-speed intelligent cameras and AI-based image analysis, the system detects crystal points, black spots, impurities, scratches, and pinholes across diverse film materials. With 200 kHz imaging and HDR dynamic capture, it ensures distortion-free imaging and consistent precision. Combined with multi-angle LED illumination and adaptive control, it supports different web widths and film types. The system auto-generates defect maps and trend reports, and the SYAITR platform enables continuous deep-learning optimization. Applicable to packaging film, optical film, and lithium separator production lines.
Intelligent Camera
Deep Learning
Defect Recognition
Real-Time Analysis