High-Speed Paper Defect Inline Inspection System
Built on Shuangyuan’s self-developed WIS platform, the system integrates high-frequency intelligent cameras, FPGA processing boards, and deep-learning algorithms to achieve full-width, high-speed defect detection at 0.1 mm accuracy. It identifies holes, fiber lumps, hairs, insects, foreign matter, black or bright spots, stains, wrinkles, and other paper defects in real time. The system supports defect display, alarms, classification, trend analysis, and automated report generation. Featuring 10 GigE data transmission and AI model online updates, it is widely applied to newsprint, coated, and tissue-paper machines, helping mills trace root causes, enhance product quality, and improve production efficiency.
AI Deep Learning
Intelligent Camera
Defect Detection & Classification
Real-Time Data Analysis