Radiation Sensor
Utilizing β sources (Kr-85, Pm-147, Sr-90) and multi-energy X-ray, these sensors provide non-contact measurement of basis weight and thickness with strong penetration, fast response, and high anti-interference capability. Core components include self-developed ionization chambers and thermostatic modules for long-term stability and repeatability. The system supports drift correction and three-standard self-check calibration, ensuring high accuracy. Widely used for paper, film, sheet, foil, nonwoven, and lithium-electrode materials, the sensors deliver 0.01 gsm resolution when combined with a scanner, offering fast response and seamless closed-loop integration.
Radiation Sensing
Inline Thickness
β-/X-ray
Self-Developed Ion Chamber
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