PV Backsheet Thickness Measurement
Utilizing white-light interferometry and spectral confocal technologies, this system performs high-precision, non-contact thickness analysis for solar-cell backsheet and multilayer films. White-light interferometry measures nanometer-scale multilayer thickness with high frequency and safety, while spectral confocal sensing offers anti-interference and multi-angle capability for middle-layer flatness and uniformity analysis. The system can be embedded into production lines for real-time measurement, automatic evaluation, and profile mapping, supporting solar glass, encapsulation film, and coated-backsheet manufacturing.
White-Light Interferometry
Spectral Confocal
Non-Contact Measurement
Thickness Measurement