High-Speed Paper Defect Inspection System (WIS)

High-Speed Paper Defect Inspection System (WIS)

Combining image-processing algorithms with AI machine vision, the WIS system performs real-time, high-speed defect localization and intelligent classification on the paper machine. It identifies and outputs defect type, image, size, position, and distribution maps, detecting holes, lumps, fibers, insects, foreign matter, black spots, stains, dark/bright spots, wrinkles, and formation issues with 0.1 mm precision. All core hardware and software are self-developed for high integration and reliability, enabling stable and efficient paper-machine operation.

AI Machine VisionIn

AI Machine VisionIn

line Paper-Defect Inspection

line Paper-Defect Inspection

Image-Processing Algorithms

Image-Processing Algorithms

Intelligent Classification

Intelligent Classification

+86   0571-88912732
+86   0571-88912732